A Textbook of Atomic Force Microscopy Author

By: Bahl, BijenderMaterial type: TextTextLanguage: Eng. Publication details: New Delhi. : Cyber Tech Publications, 2011Edition: 1st edDescription: 270 p. PAPER BACK 22cmISSN: 9788178847450Subject(s): Electronic, communicationDDC classification: 502.82 Summary: Atomic, force, force microscopy.
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Reference Reference ADBU Azara Campus Library
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ADBU Azara Campus Library
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Reference 502.82 BAH (Browse shelf(Opens below)) 1 Not For Loan Placed in Reference stack. 12867

Electronic & Communication

Atomic, force, force microscopy.

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