A Textbook of Atomic Force Microscopy Author

By: Bahl, BijenderMaterial type: TextTextLanguage: Eng. Publication details: New Delhi. : Cyber Tech Publications, 2011Edition: 1st edDescription: 270 p. PAPER BACK 22cmISSN: 9788178847450Subject(s): Electronic, communicationDDC classification: 502.82 Summary: Atomic, force, force microscopy.
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Item type Current library Home library Collection Call number Copy number Status Notes Date due Barcode
Reference Reference ADBU Azara Campus Library
Reference 		ADBU Azara Campus Library
Reference 		Reference 502.82 BAH (Browse shelf(Opens below)) 1 Not For Loan Placed in Reference stack. 12867

Electronic & Communication

Atomic, force, force microscopy.

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